Abstract: Semantic segmentation for wafer transmission electron microscopy (TEM) images plays a crucial role in the automated measurement of semiconductors. However, the automated measurement of wafer ...
1 College of Information and Technology, Jilin Agricultural University, Changchun, China 2 College of Horticulture, Jilin Agricultural University, Changchun, China In order to overcome the key ...
Abstract: Precisely identifying objects of interest in remote sensing imagery requires not only accurate classification but also precise delineation of their location, scale, and orientation. However, ...
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