EDN

A simpler circuit for characterizing JFETs

Combining Cor Van Rij's JFET test socket with two DMMs, a current limiter, switches and a wall wart yield a simple, accurate ...
Semiconductor Engineering

Advanced Packaging Traceability And Root Cause Analysis

One of the defining challenges of advanced packaging lies in maintaining traceability as dies move through multiple ...
Semiconductor Engineering

Chiplet Integration and Testing: Key Lessons for Next-Gen Semiconductor Packaging

How evolving standards, design-for-test strategies, and automation are shaping efficient production testing for 2.5D and 3D ...
IEEE

A Robust Solver for Phasor-Domain Short-Circuit Analysis With Inverter-Based Resources

Abstract: The integration of Inverter-Based Resource (IBR) model into phasor-domain short circuit (SC) solvers challenges their numerical stability. To address the challenge, this paper proposes a ...
IEEE

Large-Signal Stability Analysis of Grid-Forming Inverters With Equivalent-Circuit Models

Abstract: This paper proposes an energy function-based direct method for large-signal stability assessment of grid-forming (GFM) inverters leveraging an equivalent-circuit representation of all ...
GitHub

CMOS XOR Gate Design – Cadence Virtuoso

The following schematic shows the CMOS implementation of a 2-input XOR gate using complementary pull-up and pull-down networks: Figure: CMOS XOR gate schematic drawn in Cadence Virtuoso. Input A: ...