Over 50 years ago, the first commercially available SEM was unveiled. Yet, to this day no internationally accepted standard exists for the determination of SEM resolution. Further, to confuse matters ...
A comparison of experimental annular dark field (ADF)-scanning transmission electron microscopy (STEM) and electron ptychography in uncorrected and aberration-corrected electron microscopes. In the ...
Researchers have shown that expensive aberration-corrected microscopes are no longer required to achieve record-breaking microscopic resolution. Researchers at the University of Illinois at ...
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