STMicroelectronics, a global semiconductor leader serving customers across the spectrum of electronics applications, announced the successful production of the world’s first semiconductor wafer whose ...

Wafer inspection has become a critical part of the semiconductor manufacturing process. Inspections performed after wafer test can analyze the marks left by probe cards to ensure that the test process ...

High testing parallelism can be achieved with contactless wafer testing, which leads to reduced production cycle times. It also eliminates the possibility of wafer damage during testing. According to ...

Semiconductor testing firm Ardentec is optimistic about its future operations, driven by sustained strong orders in ...

Semiconductor testing has traditionally functioned as a stable screening step in the manufacturing flow so that failing devices can be identified and separated prior to packaging. Test infrastructure ...

FREMONT, CA / ACCESS Newswire / August 26, 2025 / Aehr Test Systems (AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received a purchase order from a ...

The use of on-wafer superconducting materials, other novel materials, and traditional semiconductors at cryogenic temperatures (below about 123K, or -150°C) has grown quickly in recent years.

Raman spectroscopy uses inelastic scattering of protons from molecules that are covalently bound in order to identify functional groups, stresses, strains and crystallinity. It is a tool that is ...

FREMONT, CA / ACCESSWIRE / December 14, 2023 / Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an initial customer ...

Aehr and ISE Labs share a long history of collaboration and innovation, including the first installed base of Aehr's Sonoma high-power packaged part test systems. ISE Labs was also the first lab to ...

Aehr Test Systems (AEHR) has received an initial production order from a top tier automotive semiconductor supplier for a FOX-XP wafer level test and burn-in system with fully integrated FOX WaferPak ...

In a heterogeneous integrated system, the impact of composite yield fallout due to a single chiplet is creating new performance imperatives for wafer test in terms of test complexity and coverage.