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This year’s Burn-in & Test Strategies Workshop—BiTS 2016—will convene March 6-9 in Mesa, AZ. Organizers say BiTS 2016 will examine the test challenges of the Internet of Things (IoT), including the ...

BiTS 2016 general chair Ira Feldman welcomed attendees to the BiTS technical sessions this morning, noting that the goal is to focus on what’s current and coming up next with respect to the burn-in ...

A key part of the concept is that the DFT circuitry need not be used solely for test, nor would the outside controller be a test-only resource. In fact, the circuitry could be slaved to an external ...