A high-frequency center-probe test socket features a floating guide plate with a built-in hand stop to protect probes during test and eliminate damage to the package leads. Well suited for automated ...
October 9, 2014. Everett Charles Technologies (ECT) has launched the Z0 and Z1 probes—two new members of the ZIP probe family designed to meet signal-integrity challenges driven by the ever increasing ...
A rapid increase in wireless connectivity and more sensors, coupled with a shift away from monolithic SoCs toward heterogeneous integration, is driving up the amount of analog/RF content in systems ...
Semiconductor testing has traditionally functioned as a stable screening step in the manufacturing flow so that failing devices can be identified and separated prior to packaging. Test infrastructure ...
It’s a problem that has dogged electronic engineers since the first electrons were coaxed along a wire: that measuring instruments can themselves disrupt the operation of a circuit. Older multimeters ...
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