The family of electron microscopy techniques have become staple methods for imaging nanoscale objects, including nanoparticles, viruses and proteins. The appeal of electron microscopy as a ...
The Helmholtz Center for Materials and Energy in Berlin, Germany (HZB, originally known as Hahn-Meitner Institute, HMI) has developed a novel technique for the cross-sectional sample preparation for ...
By combining two fundamentally different microscopy techniques, researchers can now measure the optical properties of a ...
This article examines the use of femtosecond (fs) laser ablation for site-specific TEM sample preparation in a FIB-SEM. Various workflows are shown facilitating TEM lamella preparation of regions of ...
Revitalize your specimen preparation techniques. You'll discover innovative and creative techniques for loose powders, pressed powder briquettes, fusion beads, fusion solutions and metals. For a truly ...
In the single-beam FIB, such as our Hitachi FB-2000A FIB, some milling will occur during observation of the specimen. Surface features, such as thin films, can be milled away during this process. In ...
In transmission electron microscopy (TEM), where the electron beam passes through the sample to be directly imaged on the detector below, it is often necessary to support the thin samples on a grid.
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