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Detecting 'hidden defects' that degrade semiconductor performance with 1,000X higher sensitivity
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
KAIST detects ‘hidden defects’ that degrade semiconductor performance with 1,000× higher sensitivity
Semiconductors are used in devices such as memory chips and solar cells, and within them may exist invisible defects that ...
Layered double hydroxides (LDHs) are emerging as promising electrocatalysts for the oxygen evolution reaction (OER), a key barrier in clean hydrogen production. However, their catalytic performance ...
The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...
TSMC exposed the defect density (D0) of its N2 process technology relative to its predecessors at the same stage of development at its North American Technology Symposium this week. According to the ...
Silicon carbide (SiC) is a wide-bandgap semiconductor material utilized in high-power, high-temperature, and high-frequency electronic devices. 4H-SiC substrates have distinct characteristics, ...
Originating as a theoretical prediction in the 1940s, with experimental isolation from graphite in 2004, graphene has quickly become a desirable quantum material used in various application areas, ...
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