The rapid development of deep learning in recent years is largely due to the rapid increase in the scale of data. The availability of large amounts of data is revolutionary for model training by the ...
An international research team has developed a novel PV fault detection method based on deep learning of aerial images. The proposed methodology utilizes the convolutional neural network (CNN) ...
In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...
CHICAGO--(BUSINESS WIRE)--GE HealthCare (Nasdaq: GEHC) unveiled three new advanced deep learning image processing and reconstruction solutions as a part of its Effortless Recon DL portfolio at the ...