A newly drafted IEEE standard will bring more consistency to defect metrics in analog/mixed (AMS) designs, a long-overdue step that has become too difficult to ignore in the costly heterogeneous ...

The transition to the 2nm technology node introduces unprecedented challenges in Automated Test Equipment (ATE) bring-up and manufacturability. As semiconductor devices scale down, the complexity of ...

As vehicles become increasingly software-defined, the root cause of many modern safety recalls is shifting away from purely ...

Software defect prediction and quality assurance are critical fields in modern software engineering that focus on identifying error-prone components early in the development cycle. By utilising ...