For quality control purposes, wafers, such as semiconductor or flat-panel display (FPD) chips, need to be examined under a microscope to verify that they meet specifications related to both circuit ...
RESEARCH TRIANGLE PARK, N.C.--(BUSINESS WIRE)--Researchers sponsored by Semiconductor Research Corporation (SRC), the world's leading university-research consortium for semiconductors and related ...
Context-aware physical verification (PV) is a relatively new addition to traditional PV flows, but it has quickly become a critical and essential technology that addresses the increasing complexity of ...
The main goal of the LCP circuit technology development was to provide a high-speed, high-density alternative to conventional printed circuit fabrication techniques. As semiconductor and electronics ...
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